Accessories

20-stub auto-relocation substage

Allows samples to be held in their positions while in storage, permitting particles or areas of interest to be easily relocated when reinserted into the SEM. Comprises the relocation pedestal, central location screw and calibration stub mount, 1x 20 hole top plate. Accommodates Agar 12.7 mm pin stubs. For FEI, Zeiss microscopes.
Price: 900,00 €

8-stub auto-relocation substage

Allows samples to be held in their positions while in storage, permitting particles or areas of interest to be easily relocated when reinserted into the SEM. Comprises the relocation pedestal, central location screw and calibration stub mount, 1x 8 hole top plate. Accommodates Agar 12.7 mm pin stubs. For FEI, Zeiss microscopes.
Price: 850,00 €

20-Stub Top Plate

Allows samples to be held in their positions while in storage, permitting particles or areas of interest to be easily relocated when reinserted into the SEM (FEI, ZEISS). Comprises the top sample plate only. Accommodates Agar 12.7 mm pin stubs.

Price: 600,00 €

8-Stub Top Plate

Allows samples to be held in their positions while in storage, permitting particles or areas of interest to be easily relocated when reinserted into the SEM (FEI, ZEISS). Comprises the top sample plate only. Accommodates Agar 12.7 mm pin stubs.

Price: 450,00 €

Dual-Axis Motorized Comparison Substage

Ballistic Comparison Substage (BCS) allows two cylindrical objects to be compared in the SEM (FEI, TESCAN). The objects can be cartridge cases, bullets or any cylindrical object. Package includes Flatview software (see Software page).

Features: Accommodates bullets and cartridge casings for all common ammunition

  • Direct comparison or two independently rotatable samples (2 motors; digitally encoded)
  • Rotation via user interface controls
  • Substage mount compatible with GSR relocating substage system without removal of GSR standard.
  • Substage mount compatible with GSR relocating substage system without removal of GSR standard.
  • Rotation speeds from 1 to 40°/second
  • Bi-directional rotation
  • Software support via BallisticSEM and Flatview software (included – see description below) Can be used with or without GSR system.
  • Computer controlled 2-axis ballistic comparison substage for Quanta (400 and 600) and XL (XL30 100×100) and XL40, Tescan XM and LM. Two axes digitally indexed to support Flatview (image roll-out) software function.

Price: 15000.00 €

System Validation Devices – MICROVALIDATOR

Special validation hardware and software designed to automatically check several SEM functions, EDS and BSD detector efficiency, column alignment (from analytical point of view), and EDS imaging calibration.

A sample mount contains several certified standards, such as a tin balls sample, a magnification standard, and a special stub that allows fully automatic SEM/EDS diagnosis. It also includes a certified particle test sample to test for field stitching errors and EDS classification.

Special GSR standard are also available, designed for the adjustment, calibration and validation of analytical SEM/EDX systems when used for automatic analysis of GSR particles.

All samples are certified and each one serialized, fully characterized and documented. After the test run, the system reports any error or misalignment.

MicroValidator includes an integrated specimen current meter, and connections for monitoring various SEM and EDS video signal outputs (ADCs). The specimen current meter and the video inputs are controlled via one USB port on the host PC. The meter is powered by USB. Microvalidator requires a standard either CAL_STUB_15 (general use) or CAL_STUB_16 (GSR use). For FEI microscopes with Edax, Bruker.

Price: 6500,00 €