SEM of a cartridge case in flatview
Calibration and reference standards, calibration and reference stubs for SEM quantitative microanalysis
Calibration standards / calibration stubs – EDS, BSD, microValidator standards covering a wide range of metals and alloys for all common electron microscopes including FEI, Hitachi, Jeol …

Reference standards / reference stubs – for particle and phase analysis, cathodoluminescence, polymorphs and minerals

Accessories and service
– specialist holders so you can quickly relocate areas on stored samples, comparison substages for ballistics analysis, automatic SEM system validation

Software – SEM/EDS analysis, gunshot residue emulators, ballistic SEM for comparing cartridges.

Contact details: masonkn@skynet.be or cameronaj@skynet.be